© The Institution of Engineering and Technology
The use of bidirectional temperature sweeping methods in a standard circuit simulator to determine the presence or absence of multiple equilibrium points in analogue circuits is discussed along with the need for start-up circuits to eliminate undesired stable equilibrium points. Signatures in the temperature characteristics of circuits that may have more than one equilibrium state in their resistive circuit and that are indicative of specific types of performance are identified. It is shown that circuits with some of these signatures present significant challenges for circuit simulation and verification when designed to operate at a single equilibrium point. It is also observed that circuits with some of these signatures can exhibit useful circuit properties but also provide vulnerability to harbour analogue hardware Trojans that can be very difficult to detect.
References
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-
1)
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3. Wang, Y.-T., Wang, Q., Chen, D., et al: ‘Hardware Trojan state detection for analog circuits and systems’. Aerospace and Electronics Conf., NAECON, Dayton, OH, USA, June 2014, pp. 364–367.
-
2)
-
5. Wang, Q., Geiger, R.L., Chen, D.J.: ‘A programmable temperature trigger circuit’. Int. Symp. on Circuits and Systems (ISCAS), Lisbon, Portugal, May 2015, pp. 1070–1073.
-
3)
-
1. Nielsen, R.O., Willson, A.N.Jr.: ‘A fundamental result concerning the topology of transistor circuits with multiple equilibria’. Proc. IEEE, 1980, 68, (2), pp. 196–208 (doi: 10.1109/PROC.1980.11617).
-
4)
-
2. Wang, Y.-T., Chen, D., Geiger, R.L.: ‘Practical methods for verifying removal of Trojan stable operating points’. Int. Symp. on Circuits and Systems (ISCAS), Beijing, China, May 2013, pp. 2658–2661.
-
5)
-
4. Wang, Q., Geiger, R.L., Chen, D.J.: ‘Challenges and opportunities for determining presence of multiple equilibrium points with circuit simulators’. IEEE Midwest Symp. on Circuits and Systems (MWSCAS), College Station, TX, USA, August 2014, pp. 406–409.
http://iet.metastore.ingenta.com/content/journals/10.1049/el.2015.2102
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