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access icon free On-chip picosecond resolution timing measurement using time amplifier

  • Author(s): Peiyong Zhang 1 ; Chenhui Feng 1 ; Huiyan Wang 2
    • View affiliations
    • Affiliations: 1: College of Electrical Engineering, Zhejiang University, Hangzhou, Zhejiang, People's Republic of China ;
      2: Department of Computer Science and Information Engineering, Zhejiang Gongshang University, Hangzhou, Zhejiang, People's Republic of China
  • Source: Volume 51, Issue 18, 03 September 2015, p. 1416 – 1418
    DOI:  10.1049/el.2015.1202 , Print ISSN 0013-5194, Online ISSN 1350-911X
© The Institution of Engineering and Technology
Received 08/04/2015, Published 25/08/2015
Errata or comment

Timing parameters of the standard cell library are essential for static timing analysis. An on-chip picosecond resolution timing measurement system is presented. The system measures the rise/fall time of the signal and the setup/hold time of the flip flop. Compared with the SPICE simulation, the on-chip physical measurement considerably improves the resolution of the timing parameters.

Inspec keywords: flip-flops; measurement systems; amplifiers; integrated circuit measurement

Other keywords: static timing analysis; on-chip picosecond resolution timing measurement system; on-chip physical measurement; flip flop; standard cell library; SPICE simulation; timing parameter resolution; time amplifier

Subjects: Amplifiers; Logic circuits; Logic and switching circuits

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      • 4. Chen, J.C., McGaughy, B.W., Sylvester, D., Hu, C.: ‘An on-chip, attofarad interconnect charge-based capacitance measurement (CBCM) technique’. IEEE Int. Electron Device Meeting, San Francisco, CA, USA, December 1996, pp. 69–72.
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