access icon free AlN film SAW resonator integrated with metal structure

A novel surface acoustic wave (SAW) resonator integrated on a metal substrate is presented. The devices were fabricated on the aluminium nitride (AlN) thin films deposited by mid-frequency magnetron sputtering on polished TC4 titanium alloy substrates. Using a two-step growth method, AlN film with a full-width at half-maximum of 4.1° had been prepared. The AlN film SAW resonator shows a resonance frequency of 129 MHz and an electromechanical coupling coefficient of 0.28%. The measurement results agree well with the simulation results. This integrated SAW resonator can be used as a good strain sensor in metal structure health monitoring.

Inspec keywords: titanium alloys; aluminium compounds; surface acoustic wave resonators; sputter deposition; wide band gap semiconductors; thin film devices

Other keywords: AlN; frequency 129 MHz; surface acoustic wave resonator; electromechanical coupling coefficient; metal substrate; resonance frequency; metal structure health monitoring; TC4 titanium alloy substrates; strain sensor; aluminium nitride thin films; integrated SAW resonator; midfrequency magnetron sputtering

Subjects: Acoustic wave devices; Sputter deposition; Thin film circuits

References

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http://iet.metastore.ingenta.com/content/journals/10.1049/el.2014.3495
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