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access icon free Thru-reflect-line calibration for substrate integrated waveguide devices with tapered microstrip transitions

  • Author(s): E. Diaz Caballero 1 ; A. Belenguer 2 ; H. Esteban 3 ; V.E. Boria 3
    • View affiliations
    • Affiliations: 1: Instituto de Telecomunicaciones y Aplicaciones Multimedia, Universitat Politecnica de Valencia, Valencia, Spain
      2: Ingenieria Electrica, Electronica, Automatica y Comunicaciones, Universidad de Castilla-La Mancha, Cuenca, Spain
      3: Ingenieria Electrica, Electronica, Automatica y Comunicaciones, Universidad Politencia de Valencia, Spain
  • Source: Volume 49, Issue 2, 17 January 2013, p. 132 – 133
    DOI:  10.1049/el.2012.3027 , Print ISSN 0013-5194, Online ISSN 1350-911X
© The Institution of Engineering and Technology
Published

One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lies in the need of a good interconnection with planar structures. In this reported work, the negative effects produced by the connectors and the tapered microstrip-to-SIW transitions are de-embedded from the measurements of the SIW structure by a thru-reflect-line calibration with an adequate and cheap SIW calibration kit.

Inspec keywords: planar waveguides; substrate integrated waveguides; waveguide transitions; calibration

Other keywords: tapered microstrip transitions; substrate integrated waveguide devices; thru-reflect-line calibration; planar structures; SIW devices

Subjects: Waveguides and microwave transmission lines

References

    1. 1)
      • Abdolhamidi, M., Enayati, A., Shahabadi, M., Faraji-Dana, R.: `Wideband single-layer dc-decoupled substrate integrated waveguide (SIW)-to-microstrip transition using an interdigital configuration', Proc. Asia-Pacific Microwave Conf., (APMC 2007), 2007, Bangkok, p. 1–4.
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      • Chen, C.-J., Chu, T.-H.: `Analytical characterization of S-matrix reconstruction transforms on multiport networks', Proc. of 2011 Asia-Pacific Microwave Conf., 2011, Melbourne, Australia.
    5. 5)
      • Deslandes, D.: `Design equations for tapered microstrip-to-substrate integrated waveguide transitions', IEEE 2010 MTT-S Int. Microwave Symp. Dig., 2010, Anaheim, CA, USA, p. 704–707.
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      • ‘Specifying calibration standards for the Agilent 8510 network analyzer’, Agilent Product Note 8510-5B, Tech. Rep.
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