© The Institution of Engineering and Technology
Presented is a new test method that consists in monitoring on-chip internal voltages during susceptibility tests of integrated circuits. An on-chip sensor was installed at several internal nodes within low-dropout regulators to measure the distortion of internal signals induced by the coupling of electromagnetic interference. The comparison between external and internal measurement results shows that on-chip sensor techniques enhance the extraction of circuit susceptibility levels, especially at high frequencies.
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http://iet.metastore.ingenta.com/content/journals/10.1049/el.2012.0407
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