Highly-linear time-difference amplifier with low sensitivity to process variations

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Highly-linear time-difference amplifier with low sensitivity to process variations

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A novel time-difference amplifier (TDA) is presented. The proposed circuit has a larger linear operation region with less sensitivity to process variations than the state-of-the-art TDAs. Two TDAs with gains of two and 20 have been simulated in a 65 nm CMOS process to validate the proposed architecture. Simulation results show less than 0.1% gain error for ±400 ps input time difference range, ten times the range of conventional TDAs. The proposed TDA consumes 740 µW from a 1 V supply.

Inspec keywords: CMOS analogue integrated circuits; differential amplifiers

Other keywords: time 400 ps; highly-linear time-difference amplifier; size 65 nm; process variations; time -400 ps; voltage 1 V; power 740 muW; CMOS process

Subjects: Amplifiers; CMOS integrated circuits

References

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      • Oulmane, M., Roberts, G.W.: `A CMOS time amplifier for femtosecond resolution timing measurement', Proc. IEEE Int. Symp. Circuits and Systems, (ISCAS), 2004, Vancouver, BC, Canada, p. 509–512.
http://iet.metastore.ingenta.com/content/journals/10.1049/el.2011.1279
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