Asymmetric dithering technique for bias condition monitoring in optical QPSK modulator

Asymmetric dithering technique for bias condition monitoring in optical QPSK modulator

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A simple and highly sensitive bias condition monitoring circuit is presented for optical quadrature phase shift keying (QPSK) modulators. The proposed asymmetric dithering technique is shown to be capable of monitoring three bias states simultaneously. The dithering penalty is shown to be less than 0.2 dB.


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