Your browser does not support JavaScript!
http://iet.metastore.ingenta.com
1887

Remote Attestation for Intelligent Electronic Devices in Smart Grid Based on Trusted Level Measurement

Remote Attestation for Intelligent Electronic Devices in Smart Grid Based on Trusted Level Measurement

For access to this article, please select a purchase option:

Buy article PDF
$19.95
(plus tax if applicable)
Buy Knowledge Pack
10 articles for $120.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Chinese Journal of Electronics — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

To reduce the implementation complexity and excessive overhead caused by remote attestation, we propose a new remote attestation scheme based on trusted level measurement considering the limited system resources of the Intelligent electronic devices (IEDs) in smart grid. In this scheme, a lightweight trusted level measurement mechanism is designed, and a new dynamic weighted multi-classifier integration method based on Binary tree Support vector machine (BT-SVM) is proposed. The trusted level of configuration information and running state of an IED are measured through trusted third party. The measurement parameters and attestation period are dynamically adjusted according to different trusted levels of an IED, so that reducing computational overhead and communication delays in remote attestation process. Analysis and experiments show that the proposed scheme can enhance the security of IEDs in smart grid by occupying a small amount of computation and communication resources.

http://iet.metastore.ingenta.com/content/journals/10.1049/2020.02.019
Loading

Related content

content/journals/10.1049/2020.02.019
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address