OPTIMIZED MEASUREMENT METHOD OF SMALL GAUGE LENGTH USING STEGER ALGORITHM
OPTIMIZED MEASUREMENT METHOD OF SMALL GAUGE LENGTH USING STEGER ALGORITHM
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- Author(s): Y. Liu 1 ; H. Gao 2 ; Y. Cheng 3 ; Z. Wang 1 ; S. Sun 2
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View affiliations
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Affiliations:
1:
School of Instrumentation and Optoelectronic Engineering, Beihang University , Beijing 100191 , China ;
2: National Institute of Metrology , Beijing 100013 , China ;
3: College of Metrology & Measurement Engineering, China Jiliang University , Hangzhou 310018 , China
Source:
The 8th International Symposium on Test Automation & Instrumentation (ISTAI 2020),
2021
p.
111 – 115
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Affiliations:
1:
School of Instrumentation and Optoelectronic Engineering, Beihang University , Beijing 100191 , China ;
- Conference: The 8th International Symposium on Test Automation & Instrumentation (ISTAI 2020)
- DOI: 10.1049/icp.2021.1301
- ISBN: 978-1-83953-506-2
- Location: Online Conference
- Conference date: 28-29 November 2020
- Format: PDF
Described an measuring system for the use of gauge block measurement. Optical sources of the system is a highly stabilized laser with the wavelength of 532nm, and a 633nm wavelength laser of worse laser monochromaticity. For the use of interference graph capturing, a CCD sensor is introduced into the system. Fractional part of the interference fringes is calculated by image processing procedures. Gauge length is obtained by the interference fringe fraction coincident method. By applying Steger algorithm to extract by fringe centerline, fractional part of the interference fringe order can be accurately obtained. Highly accurate gauge length measurement in relatively simple experiment conditions can be realized with the system, as the demand on laser monochromaticity that interference fringe fraction coincidence method raises can be markedly decreased.
Inspec keywords: gauges; length measurement; measurement by laser beam; light interferometry; neural nets; image processing; CCD image sensors
Subjects: Metrological applications of lasers; Image detectors, convertors, and intensifiers; Spatial variables measurement; Spatial variables measurement; Other field effect integrated circuits; Optical, image and video signal processing; Optical interferometry; Metrological applications of lasers; Image sensors; Image processing and restoration
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