Investigation into the Switching Transient of SiC MOSFET Using Voltage/Current Source Gate Driver
Investigation into the Switching Transient of SiC MOSFET Using Voltage/Current Source Gate Driver
- Author(s): H. Wu 1, 2 ; X. Wang 1 ; J. Ortiz-Gonzalez 3 ; O. Alatise 3 ; V. Pickert 1
- DOI: 10.1049/icp.2021.1290
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- Author(s): H. Wu 1, 2 ; X. Wang 1 ; J. Ortiz-Gonzalez 3 ; O. Alatise 3 ; V. Pickert 1
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View affiliations
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Affiliations:
1:
School of Engineering, Newcastle University , Newcastle , UK ;
2: Department of Mathematics, Physics and Electrical Engineering, Northumbria University , Newcastle , UK ;
3: School of Engineering, University of Warwick , Coventry , UK
Source:
The 10th International Conference on Power Electronics, Machines and Drives (PEMD 2020),
2021
p.
657 – 662
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Affiliations:
1:
School of Engineering, Newcastle University , Newcastle , UK ;
- Conference: The 10th International Conference on Power Electronics, Machines and Drives (PEMD 2020)
- DOI: 10.1049/icp.2021.1290
- ISBN: 978-1-83953-542-0
- Location: Online Conference
- Conference date: 15-17 December 2020
- Format: PDF
This paper investigates the influence of current-source and voltage-source gate driver on the switching transient performance of trench and planner SiC MOSFETs. Devices have been tested at different temperatures and switching speeds using the designed double-pulse testing system. To evaluate the performance of different gate driving approaches, the dynamic transients of SiC MOSFETs are analysed and discussed using different values of gate resistors and controlled gate currents. The results show that the current-source gate driver has a higher switching speed than voltage-source counterparts at the same transient changing rate of drain-source voltage, resulting in lower operating losses for the power devices. Therefore, current-source gate drivers can facilitate power converters to achieve higher efficiency compared with voltage-source gate drivers.
Inspec keywords: transient analysis; wide band gap semiconductors; switching transients; MOSFET; semiconductor device models; silicon compounds; semiconductor device testing
Subjects: Semiconductor device modelling, equivalent circuits, design and testing; Insulated gate field effect transistors