An IGBT junction temperature evaluation model for DC interruption application

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An IGBT junction temperature evaluation model for DC interruption application

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The 16th IET International Conference on AC and DC Power Transmission (ACDC 2020) — Recommend this title to your library

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Inspec keywords: insulated gate bipolar transistors; short-circuit currents; circuit breakers; finite element analysis; temperature distribution

Subjects: Switchgear; Numerical analysis; Finite element analysis; Insulated gate field effect transistors; Power semiconductor devices; Bipolar transistors

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