Transient junction temperature prediction of IEGT in modular multilevel converter sub-module based on FEM

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Transient junction temperature prediction of IEGT in modular multilevel converter sub-module based on FEM

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The 16th IET International Conference on AC and DC Power Transmission (ACDC 2020) — Recommend this title to your library

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Inspec keywords: finite element analysis; power bipolar transistors; computational fluid dynamics; HVDC power transmission; insulated gate bipolar transistors; short-circuit currents; HVDC power convertors

Subjects: Power convertors and power supplies to apparatus; Insulated gate field effect transistors; d.c. transmission; Power semiconductor devices; Reliability; Product packaging; Bipolar transistors

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