SEE analysis and mitigation for FPGA and digital ASIC devices
SEE analysis and mitigation for FPGA and digital ASIC devices
- Author(s): R. Weigand
- DOI: 10.1049/ic:20050514
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- Author(s): R. Weigand Source: IEE Seminar on Cosmic Radiation - Single Event Effects and Avionics, 2005 page ()
- Conference: IEE Seminar on Cosmic Radiation - Single Event Effects and Avionics
- DOI: 10.1049/ic:20050514
- ISBN: 0 86341 600 4
- Location: London, UK
- Conference date: 6 Dec. 2005
- Format: PDF
A collection of slides from the author's conference presentation is given. (8 pages)
Inspec keywords: field programmable gate arrays; radiation effects; application specific integrated circuits
Subjects: Mixed analogue-digital circuits; Radiation effects (semiconductor technology); Logic circuits
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