http://iet.metastore.ingenta.com
1887

SEE analysis and mitigation for FPGA and digital ASIC devices

SEE analysis and mitigation for FPGA and digital ASIC devices

For access to this article, please select a purchase option:

Buy conference paper PDF
$19.95
(plus tax if applicable)
Buy Knowledge Pack
10 articles for $120.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
IEE Seminar on Cosmic Radiation - Single Event Effects and Avionics — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

Inspec keywords: field programmable gate arrays; radiation effects; application specific integrated circuits

Subjects: Mixed analogue-digital circuits; Radiation effects (semiconductor technology); Logic circuits

Related content

content/conferences/10.1049/ic_20050514
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address