access icon free The surface chemical characterization of materials

Inspec keywords: secondary ion mass spectroscopy; photoelectron spectroscopy; electron spectroscopy; reviews; mass spectroscopic chemical analysis; X-ray photoelectron spectra; surface structure; Auger effect; spectrochemical analysis; doping profiles

Subjects: Electron spectroscopy for chemical analysis (photoelectron, Auger spectroscopy, etc.); Solid surface structure; Electron and ion microscopes and techniques; Mass spectrometers and mass spectrometry techniques; Mass spectrometry (chemical analysis); Impurity concentration, distribution, and gradients; Reviews and tutorial papers; resource letters

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content/conferences/10.1049/ic_19970825
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