Garcia, M.; Trujillo, M.; Chaves, D.: 'Global and Local Features for Bean Image Classification', IET Conference Proceedings, 2017, p. 9 (6 .)-9 (6 .), DOI: 10.1049/ic.2017.0034 IET Digital Library, https://digital-library.theiet.org/;jsessionid=b0e04fifjar7.x-iet-live-01content/conferences/10.1049/ic.2017.0034