Picking of sediment layers using multiresolution analysis

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Picking of sediment layers using multiresolution analysis

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  • DOI:  10.1049/cp:19970668
  • ISBN: 0 85296 689 X
  • Location: Southampton, UK
  • Conference date: 23-25 June 1997
  • Format: PDF
Two fully automatic algorithms are proposed for the picking of sediment layers on subbottom profile. An original approach using a Gaussian pyramid is presented, and compared to a more rigorous one using the wavelet formalism. Both algorithms extract and follow reflectors like the human eye, except in the case of very close reflectors. We then looked for complementary processing, that would enable us to add these kinds of reflectors to processed data. In order to achieve this goal, we study the influence of the wavelet choice on the results, and we are also working on chain selection criteria at high resolution.

Inspec keywords: sonar imaging; ultrasonic imaging; remote sensing; sediments; oceanographic techniques; geophysical signal processing; image resolution

Subjects: Optical information, image and video signal processing; Oceanographic and hydrological techniques and equipment; Instrumentation and techniques for geophysical, hydrospheric and lower atmosphere research; Sonar and acoustic radar; Marine sedimentation and sediments; Data and information; acquisition, processing, storage and dissemination in geophysics

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