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Generation and exploitation of high-order OAM beams for anti-counterfeiting applications

Generation and exploitation of high-order OAM beams for anti-counterfeiting applications

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2015 Fotonica AEIT Italian Conference on Photonics Technologies — Recommend this title to your library

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Inspec keywords: photoresists; electron beam lithography; iterative methods; optical design techniques; copy protection; polynomials; optical testing; optical polymers; Fourier transforms; diffractive optical elements; computer-generated holography

Subjects: Optical materials; Holography; Data security; Optical polymers and other organic optical materials; Holographic optical elements; holographic gratings; Optical system design; Computer-generated holography; Optical testing techniques

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