Fault isolation using self-organizing map (SOM) ANNS
Fault isolation using self-organizing map (SOM) ANNS
- Author(s): Zhenyou Zhang and Kesheng Wang
- DOI: 10.1049/cp.2011.0923
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- Author(s): Zhenyou Zhang and Kesheng Wang Source: IET International Communication Conference on Wireless Mobile and Computing (CCWMC 2011), 2011 p. 425 – 431
- Conference: IET International Communication Conference on Wireless Mobile and Computing (CCWMC 2011)
- DOI: 10.1049/cp.2011.0923
- ISBN: 978-1-84919-505-8
- Location: Shanghai, China
- Conference date: 14-16 Nov. 2011
- Format: PDF
Inspec keywords: time-domain analysis; production equipment; filters; feature extraction; production engineering computing; decision making; condition monitoring; manufacturing processes; self-organising feature maps; signal denoising; fault diagnosis
Subjects: Neural computing techniques; Filtering methods in signal processing; Industrial applications of IT; Inspection and quality control; Production equipment; Digital signal processing; Manufacturing processes; Maintenance and reliability; Production engineering computing