This chapter has cataloged typical types of RAM and discussed their performance characteristics. A wide range of commercial material can be obtained for RCSR application. Nevertheless, whether commercially available RAM is purchased or an effort is made to tailor a new design to the specific problem, RAM application will usually involve a trade-off between performance, cost, complexity, and ease of manufacture and maintenance. Only through knowledge of RAM performance, familiarity with the types of RAM available, and good engineering judgment will the best RCSR solution to a given problem be chosen.

Chapter Contents:

• 8.1 Introduction
• 8.2 Electromagnetic Loss Mechanisms
• 8.3 Specular Scattering from Dielectric Multilayers
• 8.3.1 Thin-Sheet Characterization Using Ohms per Square
• 8.3.2 Normal Incidence Scattering
• 8.3.3 Oblique Incidence Scattering
• 8.3.4 The Wave Matrix Approach to Scattering
• 8.3.5 An Approximate Scattering Analysis Procedure
• 8.4 Dielectric Multilayer Absorber Design and Performance
• 8.4.1 Salisbury Screens and Dallenbach Layers
• 8.4.2 Multilayer Dielectric Absorbers
• 8.5 Circuit Analog RAM and Frequency-Selective Surfaces
• 8.6 Magnetic RAM
• 8.7 Hybrid RAM and Radar Absorbing Structures
• 8.8 Nonspecular RAM
• 8.8.1 Magnetic and Dielectric Coatings for Surface Wave Control
• 8.8.2 Tapered Resistive Edge Treatments
• 8.9 Summary
• References

Inspec keywords: radar cross-sections; maintenance engineering; radar absorbing materials

Other keywords: MEMS packaging; RCSR application; RAM; maintenance; radar absorbing material

Subjects: Microwave materials and structures; Radar equipment, systems and applications