This chapter describes a selection of measurement techniques and considerations which address the above challenges presented by 5G RF requirements. The subject matter is divided into the following four sections: RF instrumentation used for common device measurements and the calibration process used to remove their main sources of error; the use of 'load-pull' measurements to characterise the response of power transistors across a range of source and load impedances; X-parameters, a popular nonlinear behavioural model used to capture the response of nonlinear devices for use in design simulations; and practical limitations of RF measurements and techniques for evaluating their associated uncertainties.

Chapter Contents:

• 3.1 Introduction
• 3.2 Non-linear vector network analyser measurements
• 3.2.1 Introduction to NVNA measurements
• 3.2.2 NVNA calibration
• 3.2.3 Time domain vs frequency domain
• 3.3 Load-pull measurements
• 3.3.1 Introduction to load-pull measurements
• 3.3.2 Load-pull set-up and measurement procedure
• 3.3.3 Typical load-pull results
• 3.4 X-parameter measurements
• 3.4.1 Basic X-parameters
• 3.4.2 Load-dependent X-parameters
• 3.5 Uncertainty in non-linear measurements
• 3.5.1 Introduction to measurement uncertainty
• 3.5.2 Tools for uncertainty evaluation
• 3.5.3 Examples of uncertainty evaluation
• 3.6 Summary
• Acknowledgements
• References

Inspec keywords: calibration; radiofrequency measurement; power transistors; 5G mobile communication; measurement uncertainty

Other keywords: power transistors; load-pull measurement; 5G devices; calibration process; 5G RF instrumentation requirements; nonlinear behavioural model; nonlinear measurements

Subjects: Power semiconductor devices; Mobile radio systems; Measurement theory; Microwave measurement techniques; Measurement standards and calibration