This chapter describes a selection of measurement techniques and considerations which address the above challenges presented by 5G RF requirements. The subject matter is divided into the following four sections: RF instrumentation used for common device measurements and the calibration process used to remove their main sources of error; the use of 'load-pull' measurements to characterise the response of power transistors across a range of source and load impedances; X-parameters, a popular nonlinear behavioural model used to capture the response of nonlinear devices for use in design simulations; and practical limitations of RF measurements and techniques for evaluating their associated uncertainties.
Non-linear measurements for 5G devices and the associated uncertainties, Page 1 of 2
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