Measurement and data processing for dynamic characterization

Measurement and data processing for dynamic characterization

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This chapter describes the techniques for measurement and post-processing of dynamic characterization data collected using the methodology described in Chapters 4-7. Measurement is a crucial consideration in performing an effective DPT. The oscilloscope, voltage probes, current sensors, and their connection to the test circuit must be carefully selected and designed. Following the test, the data processing can be implemented with any computation tool or programming language. This chapter discusses the generalized algorithms and methodologies as well as some example code and post-processing results implemented in MATLAB®. These data processing techniques allow the experimenter to analyze the dynamic behavior of the device under test and calculate key device characteristics.

Chapter Contents:

  • 8.1 Key considerations and challenges in dynamic characterization measurement
  • 8.2 Oscilloscope selection and setup
  • 8.3 Voltage probe selection and setup
  • 8.4 Current sensor selection and setup
  • 8.5 Time-alignment (deskew) of measurements
  • 8.6 Consideration of CM ringing
  • 8.7 Goals of dynamic data processing
  • 8.8 Identification of switching transient subintervals
  • 8.9 Calculation of I–V misalignment for deskew adjustment
  • 8.10 Calculation of switching energy loss
  • 8.11 Consideration of ringing and DC bias
  • 8.12 Alternative method for switching energy loss calculation
  • 8.13 Calculation of overshoot voltages and slew rates
  • 8.14 Internal waveform estimation using static and dynamic results
  • 8.15 Summary
  • References

Inspec keywords: electronic engineering computing; semiconductor device measurement; semiconductor device testing; Matlab; power semiconductor devices

Other keywords: voltage probes selection; dynamic characterization; oscilloscope selection; generalized algorithms; device under test; current sensors selection; post-processing results; MATLAB implementation; double pulse test; dynamic behavior; data processing; data measurement

Subjects: Power semiconductor devices; Electronic engineering computing; Semiconductor device modelling, equivalent circuits, design and testing

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