Your browser does not support JavaScript!
http://iet.metastore.ingenta.com
1887

Conclusions: wrap-up, open questions and challenges

Conclusions: wrap-up, open questions and challenges

For access to this article, please select a purchase option:

Buy chapter PDF
£10.00
(plus tax if applicable)
Buy Knowledge Pack
10 chapters for £75.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
ReRAM-based Machine Learning — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

This book has shown a thorough study on resistive random-access memory (ReRAM)-based nonvolatile in-memory architecture towards machine learning applications from circuit level, to architecture level, and all the way to system level.

Chapter Contents:

  • 9.1 Conclusion
  • 9.2 Future work

Inspec keywords: memory architecture; resistive RAM; learning (artificial intelligence)

Other keywords: machine learning; resistive random-access memory; ReRAM-based nonvolatile in-memory architecture

Subjects: Memory circuits; Machine learning (artificial intelligence); Storage system design; Digital storage

Related content

content/books/10.1049/pbpc039e_ch9
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address