Computational electromagnetic model of a planar near-field measurement process
Within this chapter a number of simulation techniques have been developed, each offering a different balance of sophistication and effort. Ultimately, it would perhaps be preferable to utilize a full wave three-dimensional EM solver to tackle these problems and with the passage of time this is becoming an ever more feasible option.However, until these methods can be deployed on a sufficiently large scale and can provide results in a sufficiently compact timescale, other alternative solutions will remain attractive. For many applications, the comparatively simple vector Huygens' method is sufficient and indeed it was used in the preparation of many of the sim ulated data sets that are utilized within Chapter 9 to illustrate and verify some of the more advanced transformation and correction techniques. Unfortunately, it is not possible to use these techniques to model every phenomenon that can be observed in a near-field measurement system, for example, multiple reflections between the AUT and the probe, but there is perhaps sufficient choice detailed that many situations can be accommodated.
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