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Integrated spectroscopy using THz time-domain spectroscopy and low-frequency Raman scattering

Integrated spectroscopy using THz time-domain spectroscopy and low-frequency Raman scattering

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Integrated Optics Volume 2: Characterization, devices and applications — Recommend this title to your library

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Materials are fundamental for the development of photonic devices, and a hot topic is the search for material systems suitable for the fabrication of integrated photonic devices. It is well known that Raman spectroscopy is the most effective spectro-scopic tool to assess the structural properties of a material and, in particular, its nanostructure, including the structural fluctuation at the nanoscale.

Chapter Contents:

  • 3.1 Terahertz light and excitations in the THz region
  • 3.2 Terahertz time-domain spectroscopy
  • 3.3 Light-scattering spectroscopy
  • 3.4 Boson peak investigation via THz spectroscopy and low-frequency Raman spectroscopy
  • 3.5 Conclusion
  • References

Inspec keywords: Raman spectroscopy; terahertz spectroscopy; nanofabrication; Raman spectra; fluctuations

Other keywords: integrated photonic devices; THz time-domain spectroscopy; Raman spectroscopy; nanostructure; low-frequency Raman scattering; integrated spectroscopy; structural fluctuation

Subjects: Optical spectroscopy and spectrometers; Nanometre-scale semiconductor fabrication technology

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