In this chapter, different optical characterization techniques have been pre-sented and discussed. Starting from the ellipsometry, fluorescence spectroscopy, through Fourier transform infrared spectroscopy, Raman spectroscopy to optical waveguide characterization, readers can get some necessary information about the discussed techniques.

Chapter Contents:

• 1.1 Introduction
• 1.2 Ellipsometry
• 1.2.1 Theory
• 1.2.2 Types of ellipsometers
• 1.2.3 Analysis of the data
• 1.2.4 Applications
• 1.3 Fluorescence spectroscopy
• 1.3.1 Apparatus
• 1.3.2 Data analysis
• 1.3.3 Fluorescence lifetimes
• 1.3.4 Fluorescence quenching
• 1.4 Fourier transform infrared spectroscopy (FTIR)
• 1.4.1 Theory
• 1.4.2 Apparatus
• 1.4.3 Data analysis
• 1.4.4 Applications
• 1.5 Raman spectrometry
• 1.5.1 Theory
• 1.5.2 Apparatus
• 1.5.3 Data analysis
• 1.5.4 Applications
• 1.6 Optical waveguide characterization
• 1.6.1 General
• 1.6.2 Refractive index measurements
• 1.6.3 Geometrical characterization
• 1.6.4 Optical loss measurement
• 1.7 Summary
• Acknowledgments
• References

Inspec keywords: Raman spectroscopy; ellipsometry; Fourier transform infrared spectroscopy; fluorescence spectroscopy; optical waveguides

Other keywords: Fourier transform infrared spectroscopy; fluorescence spectroscopy; optical waveguide characterization; optical characterization techniques; ellipsometry; Raman spectroscopy

Subjects: Optical waveguides and couplers; Optical polarimetry and ellipsometry; Optical spectroscopy and spectrometers