Dynamic measurement

Dynamic measurement

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In metrology, a given measurement technique has fundamental speed and accuracy limitations imposed by physical laws. Data processing allows us to overcome these limitations by using prior knowledge about the sensor dynamics. The prior knowledge considered in this paper is a model class to which the sensor dynamics belongs. We present methods that are applicable to linear time-invariant processes and are suitable for real-time implementation on a digital signal processor.

Chapter Contents:

  • 6.1 Introduction
  • 6.1.1 Literature review
  • 6.2 Problem setup
  • 6.3 Model-based vs data-driven approaches
  • 6.4 Maximum-likelihood data-driven estimation method
  • 6.5 Examples
  • 6.5.1 Methods and evaluation criterion
  • 6.5.2 Example of temperature measurement
  • 6.5.3 Example of mass measurement
  • 6.5.4 Results
  • 6.6 Conclusions and discussion
  • Acknowledgments
  • References

Inspec keywords: digital signal processing chips

Other keywords: sensor dynamics; physical laws; data processing; dynamic measurement; time-invariant processes; digital signal processor; metrology

Subjects: Digital signal processing chips; Measurement standards and calibration; Digital signal processing chips

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