Inspec keywords: scanning electron microscopy; transmission electron microscopy; nanoparticles; photoluminescence; magnetic particles; nanomagnetics; nanofabrication; X-ray photoelectron spectra; Raman spectra; ferromagnetic materials; coercive force; vacancies (crystal); cerium compounds; X-ray diffraction

Other keywords: scanning electron microscopy; Raman scattering; coercivity; saturation magnetisation; X-ray photoelectron spectroscopy; nanoparticle synthesis; residual magnetisation; high-resolution transmission electron microscopy; vacancies; fluorite cubic structure; photoluminescence spectra; cerium source; X-ray diffraction; near-UV emission; hydrothermal route; mineraliser complexant; CeO2-Ce(OH)3; ethylenediamine complexant; M-H curve; square-like nano-CeO2 mingled materials; ferromagnetism

Subjects: Magnetization curves, hysteresis, Barkhausen and related effects; Photoelectron spectra of semiconductors and insulators; Low-dimensional structures: growth, structure and nonelectronic properties; Interstitials and vacancies; Magnetic properties of nanostructures; Infrared and Raman spectra in inorganic crystals; Optical properties of other inorganic semiconductors and insulators (thin films/low-dimensional structures); Amorphous and nanostructured magnetic materials; Ferromagnetism of nonmetals; Fine-particle magnetic systems; Photoluminescence in other inorganic materials; Structure of solid clusters, nanoparticles, nanotubes and nanostructured materials