Inspec keywords: semiconductor device models; semiconductor device noise; radiation effects; noise measurement; silicon-on-insulator; 1/f noise; MOSFET

Other keywords: 1/f noise; noise measurements; low frequency noise; back channel low-frequency noise; SOI nMOS transistors; frequency dependence; 0.3 to 1 kHz; back gate threshold voltage; radiation response; preirradiation defect density; Si channel; thermally activated charge exchange; 85 to 320 K; buried oxides; temperature dependence; 170 nm; back gate noise

Subjects: Semiconductor device modelling, equivalent circuits, design and testing; Radiation effects (semiconductor technology); Insulated gate field effect transistors; Metal-insulator-semiconductor structures