Inspec keywords: embedded systems; integrated circuit testing; built-in self test; logic testing; SRAM chips; memory architecture

Other keywords: SRAM; embedded memory; charge-based testing BIST architecture; functional test algorithm generator; output processing circuitry; static random access memory; charge correlation technique; I/O direct access; built-in self test; charge monitor

Subjects: Storage system design; Logic design methods; Electronic engineering computing; Semiconductor storage; Digital circuit design, modelling and testing; Memory circuits; Semiconductor integrated circuit design, layout, modelling and testing