Inspec keywords: oscillators; electromigration; temperature sensors; hot carriers; field programmable gate arrays; clocks

Other keywords: clock cycles; stable ring oscillator; thermal issues; measurement period; digital temperature sensor; temperature-based FPGAs; electromigration; FGPAs; thermal variation; degradation effect; thermal effect; temperature environment; hot carrier injection; field-programmable gate array; negative bias temperature instability; accurate ring oscillator design

Subjects: Logic circuits; Logic and switching circuits; Other aspects of analogue and digital computers