Inspec keywords: logic testing; automatic test pattern generation; polynomials; fault diagnosis; integrated circuit testing; shift registers

Other keywords: fault detection; LFSR generation; polynomial size; concatenated technique; difficult-to-detect faults; size 65.0 nm; Berlekamp–Massey algorithm; nonconcatenated technique; automatic test PG test set; pattern generator; high test coverage; linear feedback shift register; nonconcatenated test sets; safety-critical technology; low hardware overhead; embedded system; independent polynomial expressions; test mapping; complete ATPG set; area overhead

Subjects: Interpolation and function approximation (numerical analysis); Logic circuits; Logic design methods; Logic and switching circuits; Digital circuit design, modelling and testing; Interpolation and function approximation (numerical analysis)