Inspec keywords: combinational circuits; clocks; delay lines; integrated circuit design; integrated circuit testing; integrated circuit yield; mathematical analysis; logic gates; Monte Carlo methods

Other keywords: bundled data; delay line; OR-based circuits; OR-based clocks; size 65.0 nm; process-voltage-temperature variations; Monte Carlo analysis; shipped product quality; mathematical analysis; ring-oscillator; bundled-data designs; combinational logic

Subjects: Logic circuits; Mathematical analysis; Monte Carlo methods; Pulse circuits; Digital circuit design, modelling and testing; Monte Carlo methods; Other digital circuits; Mathematical analysis; Logic and switching circuits