Inspec keywords: genetic algorithms; radiation hardening (electronics); fault tolerant computing; field programmable gate arrays; reconfigurable architectures

Other keywords: system reliability; triple modular redundancy; radiation-induced single event upsets; configuration memory error recovery; faulty components; TMR–MER systems; TMR voters; FPGA-based systems; voter checking schedule; variable-rate voter checking; scheduling configuration memory error checks; system power; vulnerable components; field-programmable gate arrays; localise configuration memory errors

Subjects: Logic and switching circuits; Logic circuits; Reliability