Inspec keywords: logic design; low-power electronics; delay circuits; nanoelectronics; logic circuits; circuit feedback

Other keywords: power-delay product; state retained dual-voltage threshold feedback sleeper-stack; BSIM4 predictive technology model parameters; logic circuits; size 45 nm; low power circuit design; exact logic state saving; deep submicron technology; C17 circuit; delay efficient circuit level leakage reduction technique; nanoscale devices; DSM technology; NAND3 gate; leakage power reduction; leakage power problem; FS-S

Subjects: Digital circuit design, modelling and testing; Logic and switching circuits; Pulse circuits; Logic design methods; Logic circuits