Inspec keywords: peripheral interfaces; calibration; CMOS digital integrated circuits; DRAM chips

Other keywords: dynamic calibration; parallel source-synchronous interfaces; masking signal; link performance; skew compensation techniques; high speed source synchronous interfaces; I/O calibration scheme; complementary metal oxide semiconductor; advanced calibration techniques; bit deskew calibration engine; DDR2 SDRAM memory interface; dynamic strobe masking system; post layout simulation

Subjects: Measurement standards and calibration; Semiconductor storage; Memory circuits; CMOS integrated circuits; Peripheral interfaces