Inspec keywords: power MOSFET; carrier mobility; radiation hardening (electronics); interface states

Other keywords: irradiation-induced threshold voltage shift; mobility; oxide-trapped charge; radiation response; power VDMOSFETs; pre-irradiation gate bias stress; power MOSFETs; interface traps; radiation hardening; gate bias stressing technique

Subjects: Radiation effects (semiconductor technology); Power semiconductor devices; Insulated gate field effect transistors