Inspec keywords: extrapolation; semiconductor device reliability; SIMOX; hot carriers; MOSFET

Other keywords: partially depleted SOI MOSFETs; degradation mechanisms; saturation level; power laws; lifetime prediction; two-stage hot-carrier-induced degradations; SIMOX; gate length range; deep submicrometre P-channel devices; logarithmic laws

Subjects: Maintenance and reliability; Interpolation and function approximation (numerical analysis); Reliability; Semiconductor doping; Numerical analysis; Metal-insulator-semiconductor structures; Insulated gate field effect transistors