Inspec keywords: gallium compounds; silicon; wide band gap semiconductors; power MOSFET; semiconductor growth; III-V semiconductors; elemental semiconductors

Other keywords: maximum current drain density; vertical configuration; peak transconductance; GaN-Si; electrical measurements; regrowth technique; current drain density; buffer layers; series resistance; fully-vertical GaN-on-Si power MOSFET; high-power metal-oxide-semiconductor field effect transistors

Subjects: Insulated gate field effect transistors; Power semiconductor devices