Inspec keywords: electrochemical analysis; arsenic compounds; infrared detectors; optimisation; indium compounds; passivation; etching

Other keywords: magnitude dark current level reduction; superlattice midwave infrared detector; optimisation; restoration chemical etching; device fabrication scheme; pin architecture; surface-related dark current suppression; electrochemical sulphur passivation scheme; InAs-InAsSb; redeposited dry etching removal

Subjects: Photodetectors; Surface treatment (semiconductor technology)