Inspec keywords: network synthesis; CMOS memory circuits; low-power electronics; coupled circuits; SRAM chips

Other keywords: dynamic power consumption; negative bit-line voltage scheme; nanometer technologies; process variations aware; process-variations impact; circuit design topology; capacitive coupling; write ability; dual-port; high-speed operation; nanocomplementary metal oxide semiconductor; CMOS technology; multiport SRAM cells; bit-interleaved architectures; area overhead; size 45 nm; single-port; static random access memory; write-assist circuits

Subjects: Memory circuits; CMOS integrated circuits; Semiconductor storage