Inspec keywords: DRAM chips; system buses; storage management

Other keywords: auto-activate operation; memory bus; high-speed DRAM interface; extra address bus pins; main memory; DRAM density increases; precharge command; unused address bus; DRAM device; multiple cycles; target row address; explicit activate command; significant performance degradation; power consumption increase; multicycle row addressing; single-cycle row; dynamic RAM; address bus width; high-density DRAM devices; row addressing scheme; novel row; high density DRAM

Subjects: Memory circuits; Semiconductor storage