Inspec keywords: power semiconductor devices; semiconductor device models; semiconductor device breakdown; MOSFET; switching circuits; avalanche breakdown

Other keywords: TCAD; rugged transistor; VDMOS transistor; vertical double diffused MOSFET; inductive switching; failure mode; destructive damage; avalanche breakdown; high current power-switching application; forward-blocking junction

Subjects: Insulated gate field effect transistors; Semiconductor device modelling, equivalent circuits, design and testing; Power semiconductor devices