Inspec keywords: failure analysis; partial discharge measurement; insulated gate bipolar transistors; semiconductor device reliability

Other keywords: electrical insulation capability; UV images; electric field reinforcement areas; dedicated PD measurement system; PD inception voltage; press-pack insulated gate bipolar transistors; PPIs; observed PD; critical electric field; electric field analysis; partial discharge measurement; press-pack IGBT submodule; insulation failure mechanism; elementary structures; PD-induced insulation failure phenomenon; phase-resolved PD analysis method

Subjects: Bipolar transistors; Dielectric breakdown and discharges; Reliability; Insulated gate field effect transistors