Inspec keywords: pulse measurement; gallium compounds; high electron mobility transistors; silicon compounds; aluminium compounds; III-V semiconductors; semiconductor device measurement; thermal resistance

Other keywords: thermal resistivity; thin Si single crystal layer; thermal resistance; AlGaN-GaN; HEMT; electrical I-V pulsed measurement; SiC; SopSiC composite substrate; microwave power application; thick polycrystalline SiC wafer

Subjects: Other field effect devices