Inspec keywords: monolithic integrated circuits; design for testability; transfer functions; integrated circuit design; switched capacitor networks; integrated circuit testing; analogue integrated circuits

Other keywords: transfer function; design for testability; DFT technique; DC voltage amplifier cascade; SC circuit; partial diagnosis; DC test; switched-capacitor circuits

Subjects: Manufacturing processes; Semiconductor integrated circuits; Testing; Active filters and other active networks; Production facilities and engineering; Time varying and switched networks