Inspec keywords: semiconductor heterojunctions; indium compounds; doping profiles; semiconductor doping; tunnel transistors; field effect transistors; III-V semiconductors; semiconductor device models; gallium arsenide

Other keywords: n-channel SJTFET; gate workfunction; source–channel doping density; semijunctionless type II heterojunction; GaAs0.1Sb0.9-InAs; doping profile; gate oxide thickness; on-state current manifests; off-state current; n-p+ drain–channel junction; drain–channel junction; tunnel barrier; short channel effects; p+-p+-n structure; semijunctionless tunnel field effect transistor; source–channel doping concentration

Subjects: Semiconductor doping; Semiconductor junctions; Other field effect devices; Semiconductor device modelling, equivalent circuits, design and testing