Inspec keywords: III-V semiconductors; p-n homojunctions; doping profiles; contact resistance; p-n heterojunctions

Other keywords: contact resistance profiling method; GaAs; InP; homostructure layers; III-V alloy multilayer structures; GaInAsP; GaAlAs; double heterostructure layers; doping profiles

Subjects: II-VI and III-V semiconductors; Electrical properties of semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions; Impurity concentration, distribution, and gradients; Semiconductor junctions; Contact resistance, contact potential, and work functions; Semiconductor doping