Inspec keywords: semiconductor device models; insulated gate field effect transistors

Other keywords: current equations; bulk doping profile; high substrate doping level; narrow-channel effects; threshold voltage; effective implanted dose; geometrical approach; analytical modelling; depletion-mode MOSFET; double conductions; non-pinch-off current; short channel effects; majority carrier diffusion; regional approaches; parasitic p⁺-n⁺ diode; buried-channel transistor

Subjects: Semiconductor device modelling, equivalent circuits, design and testing; Insulated gate field effect transistors