Inspec keywords: binary codes; Reed-Solomon codes; computational complexity; integrated circuit reliability; decoding; concatenated codes; error correction codes; BCH codes; flash memories

Other keywords: soft input decoder; error correction; bit-flipping strategy; coding gain; pipelined decoder architecture; outer Reed-Solomon codes; algebraic decoding; low-complexity soft input decoder; extended BCH codes; hard input decoding; high-rate GC codes; high-reliability data storage; high-rate generalised concatenated codes; flash memories; soft decoding approach; outer error; erasure decoding; decoder architecture; low-complexity soft input decoding; inner extended binary Bose-Chaudhuri-Hocquenghem codes

Subjects: Memory circuits; Codes; Reliability; Codecs, coders and decoders; Semiconductor storage